China Wholesale Electrostatic Field Manufacturers – LEEM-18 Measurement of V-I Characteristics of Nonlinear Components – Labor
China Wholesale Electrostatic Field Manufacturers – LEEM-18 Measurement of V-I Characteristics of Nonlinear Components – Labor Detail:
Functions
1. Master the method and the basic circuit of measuring V-I characteristics of nonlinear components.
2. Master the basic characteristics of diodes, Zener diodes and light-emitting diodes. Accurately measure their forward threshold voltages.
3. Plot the graphs of V-I characteristic curves of the above three nonlinear components.
Specifications
Description | Specifications |
Voltage source | +5 VDC, 0.5 A |
Digital voltmeter | 0 ~ 1.999 V, resolution, 0.001V; 0 ~ 19.99 V, resolution 0.01 V |
Digital ammeter | 0 ~ 200 mA, resolution 0.01 mA |
Power consumption | < 10 W |
Part List
Description | Qty |
Main electric suitcase unit | 1 |
Connection wire | 10 |
Power cord | 1 |
Experimental instruction manual | 1 |
Product detail pictures:
Related Product Guide:
"Sincerity, Innovation, Rigorousness, and Efficiency" is the persistent conception of our company for the long-term to develop together with customers for mutual reciprocity and mutual benefit for China Wholesale Electrostatic Field Manufacturers – LEEM-18 Measurement of V-I Characteristics of Nonlinear Components – Labor , The product will supply to all over the world, such as: Grenada, Jakarta, Uganda, The development of our company not only needs the guarantee of quality, reasonable price and perfect service, but also relies on our customer's trust and support! In the future, we are going to continue with the most qualified and high quality service to offer the most competitive price, Together with our customers and achieve win-win! Welcome to inquiry and consult!
By Molly from Hanover - 2018.02.04 14:13
Wide range, good quality, reasonable prices and good service, advanced equipment, excellent talents and continuously strengthened technology forces,a nice business partner.
By Nicola from Detroit - 2017.10.23 10:29
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