China Wholesale Sagnac interferometer Pricelist – LCP-25 Experimental Ellipsometer – Labor

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China Wholesale Sagnac interferometer Pricelist – LCP-25 Experimental Ellipsometer – Labor Detail:

Introduction

The manual elliptical polarimeter uses the extinction method to measure the thickness and refractive index of the film, and manually regulates the deviation and deviation angle of the test process. Ellipsometry is widely used in the measurement of dielectric thin film on solid substrate. In the method of measuring the thickness of the film, it can be measured to the thinnest and the highest precision.

Specifications

Description	Specifications
Thickness Measurement Range	1 nm ~ 300 nm
Range of Incident Angle	30º ~ 90º , Error ≤ 0.1º
Polarizer & Analyzer Intersection Angle	0º ~ 180º
Disk Angular Scale	2º per scale
Min. Reading of Vernier	0.05º
Optical Center Height	152 mm
Work Stage Diameter	Φ 50 mm
Overall Dimensions	730x230x290 mm
Weight	Approximately 20 kg

Part List

Description	Qty
Ellipsometer Unit	1
He-Ne Laser	1
Photoelectric Amplifier	1
Photo Cell	1
Silica Film on Silicon Substrate	1
Analysis Software CD	1
Instruction Manual	1

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Our advancement depends over the highly developed devices, excellent talents and continually strengthened technology forces for China Wholesale Sagnac interferometer Pricelist – LCP-25 Experimental Ellipsometer – Labor , The product will supply to all over the world, such as: Hungary, Spain, Cancun, We always insist on the principle of "Quality and service are the life of the product". Till now, our products have been exported to more than 20 countries under our strict quality control and high level service.

Fraunhofer Diffraction

Fresnel Holography

Malus Law

Newton

Optical Image Addition And Subtraction

Polarization

Reflective Holography

Single-Slit

Two-Beam Interference

Wien’S Displacement Law

The quality of the products is very good, especially in the details, can be seen that the company work actively to satisfy customer's interest, a nice supplier.