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LCP-25 Experimental Ellipsometer

Short Description:

The manual elliptical polarimeter uses the extinction method to measure the thickness and refractive index of the film, and manually regulates the deviation and deviation angle of the test process. Ellipsometry is widely used in the measurement of dielectric thin film on solid substrate. In the method of measuring the thickness of the film, it can be measured to the thinnest and the highest precision.


Product Detail

Product Tags

Specifications

Description Specifications
Thickness Measurement Range 1 nm ~ 300 nm
Range of Incident Angle 30º ~ 90º , Error ≤ 0.1º
Polarizer & Analyzer Intersection Angle 0º ~ 180º
Disk Angular Scale 2º per scale
Min. Reading of Vernier 0.05º
Optical Center Height 152 mm
Work Stage Diameter Φ 50 mm
Overall Dimensions 730x230x290 mm
Weight Approximately 20 kg

Part List

Description Qty
Ellipsometer Unit 1
He-Ne Laser 1
Photoelectric Amplifier 1
Photo Cell 1
Silica Film on Silicon Substrate 1
Analysis Software CD 1
Instruction Manual 1

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