LEEM-3 Electric Field Mapping Apparatus

Short Description:

In engineering technology, it is often necessary to know the electric field distribution of the electrode system in order to study the motion law of electrons or charged particles in the electric field. For example, in order to study the focusing and deflection of electron beam in the oscilloscope tube, it is necessary to know the distribution of the electric field of the electrode in the oscilloscope tube. In the electron tube, we need to study the influence of the introduction of new electrodes on the movement of electrons, and we also need to know the distribution of electric field. Generally speaking, in order to find out the distribution of electric field, analytical method and simulation experiment method can be used. But only in a few simple cases can the electric field distribution be obtained by analytical method. For the general or complex electrode system, it is usually determined by simulation experiment. The disadvantage of the simulation experiment method is that the precision is not high, but for the general engineering design, it can meet the requirements.