LCP-25 Experimental Ellipsometer
Introduction
The manual elliptical polarimeter uses the extinction method to measure the thickness and refractive index of the film, and manually regulates the deviation and deviation angle of the test process. Ellipsometry is widely used in the measurement of dielectric thin film on solid substrate. In the method of measuring the thickness of the film, it can be measured to the thinnest and the highest precision.
Specifications
| Description | Specifications |
| Thickness Measurement Range | 1 nm ~ 300 nm |
| Range of Incident Angle | 30º ~ 90º , Error ≤ 0.1º |
| Polarizer & Analyzer Intersection Angle | 0º ~ 180º |
| Disk Angular Scale | 2º per scale |
| Min. Reading of Vernier | 0.05º |
| Optical Center Height | 152 mm |
| Work Stage Diameter | Φ 50 mm |
| Overall Dimensions | 730x230x290 mm |
| Weight | Approximately 20 kg |
Part List
| Description | Qty |
| Ellipsometer Unit | 1 |
| He-Ne Laser | 1 |
| Photoelectric Amplifier | 1 |
| Photo Cell | 1 |
| Silica Film on Silicon Substrate | 1 |
| Analysis Software CD | 1 |
| Instruction Manual | 1 |
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